**Sharp Path Block S-67 Calibration Tablet (Ref. S-75)**
*Specifically Designed for Sharp Edge Stress Meter Calibration*
This optical path retardation calibration sheet is developed primarily for calibrating the Sharp Edge Stress Instrument (Ref. S-75). It is also suitable for calibrating Sharp polarized light stress meters, making it a versatile tool in optical stress measurement.
When used to calibrate edge stress instruments, this calibration tablet enhances the operator's confidence in the accuracy and consistency of repeated measurements. Unlike our Other uniform-path-length calibration patches, this new design features a fringe pattern that mimics the stress distribution found in laminated windshields. Specifically, there is a higher compressive stress at one edge and a small tensile stress at the opposite edge, providing a more realistic simulation of real-world conditions.
To ensure accurate calibration, the optical path retardation must be measured at four distinct locations—labeled A, B, C, and D—with point A representing the area of maximum compressive stress. This allows for precise alignment and comparison during the calibration process.
The calibration tablet is included in the verification procedure, ensuring proper setup and performance validation. When measuring birefringence (tensile stress), rotate the analyzer counterclockwise until the measured point shows the darkest possible color. For measuring the maximum compressive stress at point A, turn the analyzer clockwise until the center of the stripe aligns with the edge of the sample.
This pathlength hysteresis calibration chip comes housed in a compact chassis for easy handling and storage. The dimensions are approximately 100mm x 100mm x 9mm, making it convenient for use in various laboratory or field settings. Whether you're performing routine calibrations or conducting detailed stress analysis, this calibration tablet provides reliable and repeatable results.
Wenzhou Hesheng Electronic Co., Ltd. , https://www.heshengelec.com